構造解析・組織観察 (Material Characterization)

透過電子顕微鏡 (TEM)
  • JEOL JEM-ARM200F
  • JEOL JEM-2100F (専攻共用設備)
  • JEOL JEM-2000FX
  • JEOL JEM-2010 (専攻共用設備)
走査電子顕微鏡 (SEM)
  • JEOL JSM-7001FA (+EDS+EBSD)
  • JEOL JSM-7100F + Nanomechanics InSEM nanoindenter
光学顕微鏡 (OM)
  • Nikon Eclipse LV150N + CMOS Camera(Imaging Source DMK33UX174)
  • Nikon SMZ-800
X線回折装置 (XRD)
  • Shimadzu Laue camera system XD-3A
  • Rigaku MiniflexII
原子間力顕微鏡 (AFM)
  • Pacific nanotechnology Nano-R-K4-TH

結晶育成 (Crystal Growth)

光学式浮遊帯域溶融装置 (Optical floating zone (FZ) furnace)
  • Asgal FZ-SS35-WV (Halogen lamp)
  • Asgal FZ-20065XV (Xe Arc lamp)
雰囲気制御高周波一方向凝固炉 (Czochralski (CZ) furnace)
  • Asgal CZ-SS50
ブリッジマン炉 (Bridgman furnace)
  • Crystal Systems VFK-1800-VI-mod
非消耗アーク溶解炉 (Arc melting furnace)
  • Diavac ACM-S01-S
高周波誘導加熱装置 (High-frequency induction furnace)
  • SK medical electronics MU-αIII

物性評価 (Property Analysis)

精密万能試験機 (Universal mechanical tester)
  • Shimadzu Autograph AG-5000Bmod
  • Shimadzu Autograph AG-50kNDmod
微小機械試験装置 (Nano indenter)
  • Agilient Nano Indenter G200
  • Hysitron PI95 TEM Picoindenter
  • Shimadzu Dynamic Ultra Micro Hardness Tester DUH-211
ビッカース硬度計 (Vickers hardness tester)
  • Shimadzu Micro Vickers Hardness Tester HMV-G21DT
疲労・耐久試験機 (Fatigue Tester)
  • Shimadzu Servopulser EHF-FD1＋Servo Controller 4830
熱分析システム (Thermal analysis instrument)
  • Netzsch Differential Scanning Calorimeter DSC404 F3 Pegasaus
  • Rigaku Thermo-mechanical analyzer Thermo Plus TMA8310
水素吸蔵特性測定装置 (PCT measurement system)
  • Suzuki Shokan PCT-6SDKDHWIN
電気化学測定装置 (Electrochemistry analysys instrument)
  • Princeton Applied Research VersaSTAT4

試料作製 (Sample Preparation)

熱処理炉 (Electric furnace)
  • Nihon-tokusyukikai Vacuum Furnace VF-11-314-TM
  • Advantec Electric Muffle Furnace KB-1701
  • Advantec Electric Muffle Furnace KB-1301
  • As-one Electric Muffle Furnace HPM-0N
ワイヤー放電加工機 (Wire-cut EDM machine)
  • Brother CONT HS-300
  • Sankyo Engineering DE-75ST-2CF
  • Sankyo Engineering DE-50 3T(FC)
切断装置 (Cutting machine)
  • Heiwa Technica Fine Cut N-45AII
  • South Bay Technology Low Speed Diamond Wheel Saw Model 650
  • Ollie Wheel Diamond Saw OL-150
研磨装置 (Polishing machine)
  • Struers Labopol-5 (x2)
  • Aqra Plato F200 (x2)
  • Ikegami Seiki IS-Polisher
  • Polysystem PS-2000
  • Buehler Vibratory Polisher VibroMet2
微小加工装置 (FIB system)
  • JEOL Focused Ion Beam Sample Milling Ststem JIB-4000
TEM試料作製装置 (TEM specimen preparation equipment)
  • JEOL Ion Slicer EM-09100IS
  • JEOL Cross Section Polisher CP4
  • Gatan Precision ion polishing system PIPS Model 691 (+Cold Stage)
  • Gatan Precision ion polishing system PIPS Model 691
  • Gatan Dimple Grinder Model 656
  • Gatan Disc Grinder Model 623
  • Struers Tenupol-5
  • South Bay Technology Slurry Disc Cutter Model 360
  • South Bay Technology Bipod Polisher Model 595
  • South Bay Technology Lapping Fixture Model 145
  • South Bay Technology Lapping Fixture Model 150L
  • Fischione Plasma Cleaner Model-1020
  • JEOL Carbon Coater

理論計算 (Theoretical Calculation)

ワークステーション (Workstation)
  • Concurrent Systems TS3D-SL (x7)
  • Concurrent Systems TS3D-CL (x5)
ソフトウェア (Software)
  • Vienna Ab initio Simulation Package (VASP)

お問い合わせ先

〒606-8501
京都市左京区吉田本町
京都大学大学院工学研究科材料工学専攻
結晶物性工学分野 (乾 研究室)
TEL: 075-753-5481　FAX：075-753-5461
[研究室は京都大学吉田キャンパス本部構内 工学部物理系校舎南棟6階にあります.]